| X-RAY XDAL |
|
Fischer Technology, Inc. / Coating Thickness Gages
|
X-ray Instruments and X-ray Systems
|
High precision XYZ measuring stage, reliable results |
| DP 472 |
|
GE Inspection Technologies
|
X-ray Instruments and X-ray Systems
|
Flexible inspection geometry due to 5 programmable manipulator axis |
| 640 |
|
Matsusada Precision, Inc.
|
X-ray Instruments and X-ray Systems
|
10 bit density resolution,distance,angle and area measuring, 3D |
| DP 469 |
|
GE Inspection Technologies
|
X-ray Instruments and X-ray Systems
|
Flexible inspection geometries due to 6-axis industrial robot |
| 1600 |
|
Matsusada Precision, Inc.
|
X-ray Instruments and X-ray Systems
|
12 bit density resolution,distance,angle and area measuring, 3D |
| 5500 |
|
Matsusada Precision, Inc.
|
X-ray Instruments and X-ray Systems
|
10 bit density resolution,distance,angle and area measuring, 3D |
| 4500 |
|
Matsusada Precision, Inc.
|
X-ray Instruments and X-ray Systems
|
10 bit density resolution,distance,angle and area measuring, 3D |
| 1000 |
|
Matsusada Precision, Inc.
|
X-ray Instruments and X-ray Systems
|
8 bit density resolution,distance,angle and area measuring, 3D |
| View-X |
|
Scienscope International Corporation
|
X-ray Instruments and X-ray Systems
|
For process development, monitoring and support of rework / repair function |
| 4000 |
|
Matsusada Precision, Inc.
|
X-ray Instruments and X-ray Systems
|
10 bit density resolution,distance,angle and area measuring, 3D |
| X-RAY XDLM® - C4 |
|
Fischer Technology, Inc. / Coating Thickness Gages
|
X-ray Instruments and X-ray Systems
|
Ideal instrument for testing of mass production items |
| X-RAY XDL® - B |
|
Fischer Technology, Inc. / Coating Thickness Gages
|
X-ray Instruments and X-ray Systems
|
DCM method corrects the intensity differences of fluorescence spectra |
| FISCHERSCOPE® X-RAY |
|
Fischer Technology, Inc. / Coating Thickness Gages
|
X-ray Instruments and X-ray Systems
|
High-precision coating thickness measurement and material analysis |
| PF2400 |
|
MOXTEK, Inc.
|
X-ray Instruments and X-ray Systems
|
Small compact design, high count rates, stable resolution |
| X-RAY XUL(M)® |
|
Fischer Technology, Inc. / Coating Thickness Gages
|
X-ray Instruments and X-ray Systems
|
Bottom to top measurement direction, good for measuring small components |
| L8321-01 (Crystal Cathode) |
|
Hamamatsu Corporation USA
|
X-ray Instruments and X-ray Systems
|
Open type microfocus x-ray source, easy handling, easy maintenance |
| HiRes2-XR(S) |
|
Kappa opto-electronics Inc.
|
X-ray Instruments and X-ray Systems
|
30 fps, gamma corrections, edge enhancement function and negative image |
| DX4-XR |
|
Kappa opto-electronics Inc.
|
X-ray Instruments and X-ray Systems
|
High speed mode up to 200 frames per second, adjustable gamma correction |
| X-RAY XDVM® - W |
|
Fischer Technology, Inc. / Coating Thickness Gages
|
X-ray Instruments and X-ray Systems
|
Programmable DC motor driven X-Y stage for fast and vibration free movement |
| Video-XR(S) |
|
Kappa opto-electronics Inc.
|
X-ray Instruments and X-ray Systems
|
Gamma corrections, edge enhancement and negative image |
